Wang, P., Behan, G., Kirkland, A., Nellist, P., Cosgriff, E., D'Alfonso, A., . . . Shimojo, M. (2011). Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
芝加哥风格引文Wang, P., et al. Bright-field Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope. 2011.
MLA引文Wang, P., et al. Bright-field Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope. 2011.
警告：这些引文格式不一定是100％准确.