Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.

Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present...

書誌詳細
主要な著者:	Wang, P, Behan, G, Kirkland, A, Nellist, P, Cosgriff, E, D'Alfonso, A, Morgan, A, Allen, L, Hashimoto, A, Takeguchi, M, Mitsuishi, K, Shimojo, M
フォーマット:	Journal article
言語:	English
出版事項:	2011

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