Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.

Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present...

书目详细资料
Main Authors:	Wang, P, Behan, G, Kirkland, A, Nellist, P, Cosgriff, E, D'Alfonso, A, Morgan, A, Allen, L, Hashimoto, A, Takeguchi, M, Mitsuishi, K, Shimojo, M
格式:	Journal article
语言:	English
出版:	2011

相似书籍

Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
由: Wang, P, et al.
出版: (2010)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
由: Nellist, P, et al.
出版: (2008)

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
由: Nellist, P, et al.
出版: (2008)

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
由: Hashimoto, A, et al.
出版: (2012)

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
由: Cosgriff, E, et al.
出版: (2010)

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
由: Wang, P, et al.
出版: (2009)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
由: Nellist, P, et al.
出版: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
由: D'Alfonso, A, et al.
出版: (2008)

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
由: Wang, P, et al.
出版: (2010)

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
由: Cosgriff, E, et al.
出版: (2008)

Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy.
由: Zhang, X, et al.
出版: (2012)

Confocal operation of a transmission electron microscope with two aberration correctors
由: Nellist, P, et al.
出版: (2006)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
由: Cosgriff, E, et al.
出版: (2008)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
由: Behan, G, et al.
出版: (2009)

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
由: Behan, G, et al.
出版: (2008)

Three-dimensional elemental mapping of hollow Fe2O3@SiO2 mesoporous spheres using scanning confocal electron microscopy
由: Wang, P, et al.
出版: (2012)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopt, Part I: elastic scattering
由: Cosgriff, E, et al.
出版: (2008)

Optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
由: Behan, G, et al.
出版: (2009)

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
由: Kirkland, A, et al.
出版: (2008)

Applications of the Oxford-JEOL aberration-corrected electron microscope
由: Nellist, P, et al.
出版: (2010)

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
由: Kirkland, A, et al.
出版: (2008)

Chromatic Confocal Electron Microscopy with a Finite Pinhole Size
由: Wang, P, et al.
出版: (2012)

New possibilities with aberration-corrected electron microscopy.
由: Cockayne, D, et al.
出版: (2009)

Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM
由: Nellist, P, et al.
出版: (2007)

Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
由: Nicolosi, V, et al.
出版: (2010)

Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
由: Nicolosi, V, et al.
出版: (2010)

Progress in aberration-corrected scanning transmission electron microscopy.
由: Dellby, N, et al.
出版: (2001)

Image formation mechanisms in three-dimensional aberration-corrected scanning transmission electron microscopy
由: Cosgriff, EC
出版: (2008)

Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope
由: Nellist, P, et al.
出版: (2012)

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
由: Pennycook, S, et al.
出版: (2000)

Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM)
由: Jones, L, et al.
出版: (2012)

Contrast in atomically resolved EF-SCEM imaging
由: Wang, P, et al.
出版: (2013)

Contrast in atomically resolved EF-SCEM imaging.
由: Wang, P, et al.
出版: (2013)

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.
由: Jones, L, et al.
出版: (2014)

The Atomic Observation of the Structural Change Process in Pt Networks in Air Using Environmental Cell Scanning Transmission Electron Microscopy
由: Masaki Takeguchi, et al.
出版: (2023-07-01)

Materials advances through aberration-corrected electron microscopy
由: Pennycook, S, et al.
出版: (2006)

Materials advances through aberration-corrected electron microscopy
由: Pennycook, S, et al.
出版: (2006)

Theoretical interpretation of electron energy-loss spectroscopic images
由: Allen, L, et al.
出版: (2008)

Transmission electron microscopy without aberrations: Applications to materials science
由: Kirkland, A, et al.
出版: (2008)

Depth sectioning using electron energy loss spectroscopy
由: D'Alfonso, A, et al.
出版: (2008)