MEASUREMENT OF CONTRAST FROM INDIVIDUAL DISLOCATIONS BY LOCK-IN EBIC

MEASUREMENT OF CONTRAST FROM INDIVIDUAL DISLOCATIONS BY LOCK-IN EBIC

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Ourmazd, A, Wilshaw, P, Cripps, R
Μορφή:	Journal article
Έκδοση:	1982

Παρόμοια τεκμήρια

TEMPERATURE DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON.
ανά: Ourmazd, A, κ.ά.
Έκδοση: (1983)

THE TEMPERATURE-DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON
ανά: Ourmazd, A, κ.ά.
Έκδοση: (1983)

SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATIONS IN SILICON USING A COMPUTERIZED EBIC SYSTEM
ανά: Wilshaw, P, κ.ά.
Έκδοση: (1983)

SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATION IN SILICON USING A COMPUTERISED EBIC SYSTEM.
ανά: Wilshaw, P, κ.ά.
Έκδοση: (1983)

NEW RESULTS AND AN INTERPRETATION FOR SEM EBIC CONTRAST ARISING FROM INDIVIDUAL DISLOCATIONS IN SILICON.
ανά: Wilshaw, P, κ.ά.
Έκδοση: (1985)

DISLOCATION RECOMBINATION THEORY FOR SILICON AND INTERPRETATION OF EBIC CONTRAST IN TERMS OF FUNDAMENTAL DISLOCATION PARAMETERS.
ανά: Wilshaw, P, κ.ά.
Έκδοση: (1986)

An SEM EBIC study of the electronic properties of dislocations in silicon
ανά: Wilshaw, P, κ.ά.
Έκδοση: (1984)

EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
ανά: Wilshaw, P, κ.ά.
Έκδοση: (1991)

EBIC INVESTIGATIONS OF DISLOCATIONS AND THEIR INTERACTIONS WITH IMPURITIES IN SILICON
ανά: Fell, T, κ.ά.
Έκδοση: (1993)

AN EBIC INVESTIGATION OF ALPHA, BETA AND SCREW DISLOCATIONS IN GALLIUM-ARSENIDE
ανά: Galloway, S, κ.ά.
Έκδοση: (1993)

QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
ανά: Fell, T, κ.ά.
Έκδοση: (1991)

QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
ανά: Fell, T, κ.ά.
Έκδοση: (1991)

ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON.
ανά: Ourmazd, A, κ.ά.
Έκδοση: (1982)

THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON
ανά: Ourmazd, A, κ.ά.
Έκδοση: (1983)

THE EXPERIMENTAL REQUIREMENTS FOR QUANTITATIVE MEASUREMENT OF CARRIER RECOMBINATION AT DEFECTS IN SEMICONDUCTORS USING THE EBIC TECHNIQUE
ανά: Wilshaw, P
Έκδοση: (1989)

ON THE FORMATION OF BRIGHT EBIC CONTRASTS AT CRYSTAL DEFECTS
ανά: Blumtritt, H, κ.ά.
Έκδοση: (1989)

Impurity locking of dislocations in silicon
ανά: Giannattasio, A, κ.ά.
Έκδοση: (2004)

On the locking of dislocations by oxygen in silicon
ανά: Senkader, S, κ.ά.
Έκδοση: (2001)

ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULTS.
ανά: Ourmazd, A, κ.ά.
Έκδοση: (1982)

Locking of dislocations by oxygen in Cz-silicon
ανά: Senkader, S, κ.ά.
Έκδοση: (1999)

Out-diffusion of nitrogen from float-zone silicon measured by dislocation locking
ανά: Alpass, C, κ.ά.
Έκδοση: (2007)

A comparison between the use of EBIC and IBIC microscopy for semiconductor defect analysis
ανά: Breese, M, κ.ά.
Έκδοση: (1998)

Understanding and optimising EBIC pn-junction characterisation from modelling insights
ανά: Zhou, R, κ.ά.
Έκδοση: (2020)

Dislocation locking by nitrogen impurities in FZ-silicon
ανά: Giannattasio, A, κ.ά.
Έκδοση: (2003)

Measurements of Dislocation Locking by Near-Surface Ion-Implanted Nitrogen in Czochralski Silicon
ανά: Alpass, C, κ.ά.
Έκδοση: (2009)

Measurements of dislocation locking by near-surface ion-implanted nitrogen in Czochralski silicon
ανά: Alpass, C, κ.ά.
Έκδοση: (2008)

Oxygen-dislocation interactions in silicon at temperatures below 700 degrees C: Dislocation locking and oxygen diffusion
ανά: Senkader, S, κ.ά.
Έκδοση: (2001)

Dislocation locking in silicon by oxygen and oxygen transport at low temperatures
ανά: Senkader, S, κ.ά.
Έκδοση: (2004)

Oxygen transport in Czochralski silicon investigated by dislocation locking experiments
ανά: Murphy, J, κ.ά.
Έκδοση: (2006)

Oxygen transport in Czochralski silicon investigated by dislocation locking experiments
ανά: Murphy, J, κ.ά.
Έκδοση: (2006)

The influence of nitrogen on dislocation locking in float-zone silicon
ανά: Murphy, J, κ.ά.
Έκδοση: (2005)

The influence of nitrogen on dislocation locking in float-zone silicon
ανά: Murphy, J, κ.ά.
Έκδοση: (2005)

Oxygen and nitrogen transport in silicon investigated by dislocation locking experiments
ανά: Giannattasio, A, κ.ά.
Έκδοση: (2005)

Dislocation locking by oxygen in silicon: New insights to oxygen diffusion at low temperatures
ανά: Senkader, S, κ.ά.
Έκδοση: (2002)

THEORETICAL INVESTIGATIONS OF COMBINED CL AND EBIC MEASUREMENTS ON CRYSTAL DEFECTS
ανά: Hildebrandt, S, κ.ά.
Έκδοση: (1989)

Nitrogen transport in float-zone and Czochralski silicon investigated by dislocation locking experiments
ανά: Murphy, J, κ.ά.
Έκδοση: (2005)

Nitrogen transport in float-zone and Czochralski silicon investigated by dislocation locking experiments
ανά: Murphy, J, κ.ά.
Έκδοση: (2005)

Device parameters characterization with the use of EBIC
ανά: Oka Kurniawan
Έκδοση: (2010)

Junction depth & defect characterization with the use of EBIC
ανά: Phua, Poh Chin.
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Oxygen and nitrogen transport in silicon investigated by dislocation locking experiments (vol 152, pg G460, 2005)
ανά: Giannattasio, A, κ.ά.
Έκδοση: (2005)