MEASUREMENT OF CONTRAST FROM INDIVIDUAL DISLOCATIONS BY LOCK-IN EBIC
Үндсэн зохиолчид: | Ourmazd, A, Wilshaw, P, Cripps, R |
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Формат: | Journal article |
Хэвлэсэн: |
1982
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Ижил төстэй зүйлс
Ижил төстэй зүйлс
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SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATION IN SILICON USING A COMPUTERISED EBIC SYSTEM.
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NEW RESULTS AND AN INTERPRETATION FOR SEM EBIC CONTRAST ARISING FROM INDIVIDUAL DISLOCATIONS IN SILICON.
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