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MEASUREMENT OF CONTRAST FROM I...
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MEASUREMENT OF CONTRAST FROM INDIVIDUAL DISLOCATIONS BY LOCK-IN EBIC
Bibliografske podrobnosti
Main Authors:
Ourmazd, A
,
Wilshaw, P
,
Cripps, R
Format:
Journal article
Izdano:
1982
Zaloga
Opis
Podobne knjige/članki
Knjižničarski pogled
Podobne knjige/članki
TEMPERATURE DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON.
od: Ourmazd, A, et al.
Izdano: (1983)
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Izdano: (1983)
SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATIONS IN SILICON USING A COMPUTERIZED EBIC SYSTEM
od: Wilshaw, P, et al.
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SOME ASPECTS OF THE MEASUREMENTS OF ELECTRICAL EFFECTS OF DISLOCATION IN SILICON USING A COMPUTERISED EBIC SYSTEM.
od: Wilshaw, P, et al.
Izdano: (1983)
NEW RESULTS AND AN INTERPRETATION FOR SEM EBIC CONTRAST ARISING FROM INDIVIDUAL DISLOCATIONS IN SILICON.
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Izdano: (1985)