Direct electron detection for TEM with column parallel CCD
Step improvements in electron detectors are needed for transmission electron microscopes (TEM) to take full advantage of latest developments in electron optics and electron sources. This work presents beam tests performed with column parallel charge-coupled devices (CPCCD) and discusses measured clu...
Glavni autori: | Moldovan, G, Jeffery, B, Nomerotski, A, Kirkland, A |
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Format: | Conference item |
Izdano: |
2009
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Slični predmeti
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Imaging modes for direct electron detection in TEM with column parallel CCD
od: Moldovan, G, i dr.
Izdano: (2009) -
Can direct electron detectors outperform phosphor-CCD systems for TEM?
od: Moldovan, G, i dr.
Izdano: (2008) -
Planar transformers for column parallel CCD clock drive
od: Hawes, B, i dr.
Izdano: (2009) -
Readout chip for Column Parallel CCD, CPR2A
od: Havranek, M, i dr.
Izdano: (2009) -
Design and performance of improved Column Parallel CCD, CPC2
od: Banda, Y, i dr.
Izdano: (2010)