Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
To perform reduced density function (G(r)) analysis on electron diffraction patterns of amorphous materials formed with convergent beams, the effects of convergence must be removed from the diffraction data. Assuming electrons incident upon the sample in different directions are incoherent, this can...
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
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2003
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| _version_ | 1826275546384826368 |
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| author | McBride, W Cockayne, D Tsuda, K |
| author_facet | McBride, W Cockayne, D Tsuda, K |
| author_sort | McBride, W |
| collection | OXFORD |
| description | To perform reduced density function (G(r)) analysis on electron diffraction patterns of amorphous materials formed with convergent beams, the effects of convergence must be removed from the diffraction data. Assuming electrons incident upon the sample in different directions are incoherent, this can be done using deconvolution (Ultramicroscopy 76 (1999) 115). In this letter we show that the combination of an energy filtering transmission electron microscope with an image plate, increases the accuracy with which diffraction data can be measured and, subsequently, the accuracy of the deconvolution. |
| first_indexed | 2024-03-06T23:00:22Z |
| format | Journal article |
| id | oxford-uuid:61e50efe-4985-432b-a291-acc0ca8a1081 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-06T23:00:22Z |
| publishDate | 2003 |
| record_format | dspace |
| spelling | oxford-uuid:61e50efe-4985-432b-a291-acc0ca8a10812022-03-26T18:02:53ZDeconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:61e50efe-4985-432b-a291-acc0ca8a1081EnglishSymplectic Elements at Oxford2003McBride, WCockayne, DTsuda, KTo perform reduced density function (G(r)) analysis on electron diffraction patterns of amorphous materials formed with convergent beams, the effects of convergence must be removed from the diffraction data. Assuming electrons incident upon the sample in different directions are incoherent, this can be done using deconvolution (Ultramicroscopy 76 (1999) 115). In this letter we show that the combination of an energy filtering transmission electron microscope with an image plate, increases the accuracy with which diffraction data can be measured and, subsequently, the accuracy of the deconvolution. |
| spellingShingle | McBride, W Cockayne, D Tsuda, K Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. |
| title | Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. |
| title_full | Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. |
| title_fullStr | Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. |
| title_full_unstemmed | Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. |
| title_short | Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. |
| title_sort | deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam |
| work_keys_str_mv | AT mcbridew deconvolutionofelectrondiffractionpatternsofamorphousmaterialsformedwithconvergentbeam AT cockayned deconvolutionofelectrondiffractionpatternsofamorphousmaterialsformedwithconvergentbeam AT tsudak deconvolutionofelectrondiffractionpatternsofamorphousmaterialsformedwithconvergentbeam |