Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
To perform reduced density function (G(r)) analysis on electron diffraction patterns of amorphous materials formed with convergent beams, the effects of convergence must be removed from the diffraction data. Assuming electrons incident upon the sample in different directions are incoherent, this can...
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2003
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