Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM
Spectroscopic signals such as EDS and EELS provide an effective way of characterising multi-element samples such as Pt-Co nanoparticles in STEM. The advantage of spectroscopy over imaging is the ability to decouple composition and mass-thickness effects for thin samples, into the number of various t...
Main Authors: | Varambhia, A, Jones, L, London, A, Ozkaya, D, Nellist, P, Lozano-Perez, S |
---|---|
Format: | Journal article |
Language: | English |
Published: |
Elsevier
2018
|
Similar Items
-
Quantifying a heterogeneous Ru catalyst on carbon black using ADF STEM
by: Varambhia, A, et al.
Published: (2016) -
High-precision atomic-scale strain mapping of nanoparticles from STEM images
by: Luo, X, et al.
Published: (2022) -
EELS in the STEM: Determination of materials properties on the atomic scale
by: Browning, N, et al.
Published: (1997) -
An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field
by: Jones, L, et al.
Published: (2018) -
Structural quantification of nanoparticles by HAADF STEM
by: MacArthur, K, et al.
Published: (2014)