Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM

Spectroscopic signals such as EDS and EELS provide an effective way of characterising multi-element samples such as Pt-Co nanoparticles in STEM. The advantage of spectroscopy over imaging is the ability to decouple composition and mass-thickness effects for thin samples, into the number of various t...

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書目詳細資料
Main Authors: Varambhia, A, Jones, L, London, A, Ozkaya, D, Nellist, P, Lozano-Perez, S
格式: Journal article
語言:English
出版: Elsevier 2018