THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
New results are presented on the analysis of silicon surfaces in a Time-of-Flight Atom Probe. Comparison is made between the chemical data obtained from conventional voltage pulse and laser pulse desorption. © 1982.
| Main Authors: | , |
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| Format: | Journal article |
| Language: | English |
| Published: |
1982
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| _version_ | 1797072455365296128 |
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| author | Grovenor, C Smith, G |
| author_facet | Grovenor, C Smith, G |
| author_sort | Grovenor, C |
| collection | OXFORD |
| description | New results are presented on the analysis of silicon surfaces in a Time-of-Flight Atom Probe. Comparison is made between the chemical data obtained from conventional voltage pulse and laser pulse desorption. © 1982. |
| first_indexed | 2024-03-06T23:07:54Z |
| format | Journal article |
| id | oxford-uuid:647c61b7-3591-4289-bd41-9f0e17e3a020 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-06T23:07:54Z |
| publishDate | 1982 |
| record_format | dspace |
| spelling | oxford-uuid:647c61b7-3591-4289-bd41-9f0e17e3a0202022-03-26T18:19:10ZTHE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSISJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:647c61b7-3591-4289-bd41-9f0e17e3a020EnglishSymplectic Elements at Oxford1982Grovenor, CSmith, GNew results are presented on the analysis of silicon surfaces in a Time-of-Flight Atom Probe. Comparison is made between the chemical data obtained from conventional voltage pulse and laser pulse desorption. © 1982. |
| spellingShingle | Grovenor, C Smith, G THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS |
| title | THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS |
| title_full | THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS |
| title_fullStr | THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS |
| title_full_unstemmed | THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS |
| title_short | THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS |
| title_sort | characterization of silicon surfaces by time of flight atom probe analysis |
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