Transmission electron microscopy without aberrations: Applications to materials science
Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approac...
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| Format: | Conference item |
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2008
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| _version_ | 1826276140750209024 |
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| author | Kirkland, A Chang, L Haigh, S Hetherington, C |
| author_facet | Kirkland, A Chang, L Haigh, S Hetherington, C |
| author_sort | Kirkland, A |
| collection | OXFORD |
| description | Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods. (C) 2007 Elsevier B.V. All rights reserved. |
| first_indexed | 2024-03-06T23:09:31Z |
| format | Conference item |
| id | oxford-uuid:64f87a7b-e894-4b65-947b-3c34002b9442 |
| institution | University of Oxford |
| last_indexed | 2024-03-06T23:09:31Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | oxford-uuid:64f87a7b-e894-4b65-947b-3c34002b94422022-03-26T18:22:33ZTransmission electron microscopy without aberrations: Applications to materials scienceConference itemhttp://purl.org/coar/resource_type/c_5794uuid:64f87a7b-e894-4b65-947b-3c34002b9442Symplectic Elements at Oxford2008Kirkland, AChang, LHaigh, SHetherington, CAberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods. (C) 2007 Elsevier B.V. All rights reserved. |
| spellingShingle | Kirkland, A Chang, L Haigh, S Hetherington, C Transmission electron microscopy without aberrations: Applications to materials science |
| title | Transmission electron microscopy without aberrations: Applications to materials science |
| title_full | Transmission electron microscopy without aberrations: Applications to materials science |
| title_fullStr | Transmission electron microscopy without aberrations: Applications to materials science |
| title_full_unstemmed | Transmission electron microscopy without aberrations: Applications to materials science |
| title_short | Transmission electron microscopy without aberrations: Applications to materials science |
| title_sort | transmission electron microscopy without aberrations applications to materials science |
| work_keys_str_mv | AT kirklanda transmissionelectronmicroscopywithoutaberrationsapplicationstomaterialsscience AT changl transmissionelectronmicroscopywithoutaberrationsapplicationstomaterialsscience AT haighs transmissionelectronmicroscopywithoutaberrationsapplicationstomaterialsscience AT hetheringtonc transmissionelectronmicroscopywithoutaberrationsapplicationstomaterialsscience |