Transmission electron microscopy without aberrations: Applications to materials science
Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approac...
| Автори: | , , , |
|---|---|
| Формат: | Conference item |
| Опубліковано: |
2008
|