Transmission electron microscopy without aberrations: Applications to materials science

Transmission electron microscopy without aberrations: Applications to materials science

Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approac...

وصف كامل

التفاصيل البيبلوغرافية
المؤلفون الرئيسيون:	Kirkland, A, Chang, L, Haigh, S, Hetherington, C
التنسيق:	Conference item
منشور في:	2008

مواد مشابهة

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
حسب: Kirkland, A, وآخرون
منشور في: (2008)

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
حسب: Kirkland, A, وآخرون
منشور في: (2008)

Materials advances through aberration-corrected electron microscopy
حسب: Pennycook, S, وآخرون
منشور في: (2006)

Materials advances through aberration-corrected electron microscopy
حسب: Pennycook, S, وآخرون
منشور في: (2006)

Low-dose aberration corrected cryo-electron microscopy of organic specimens.
حسب: Evans, J, وآخرون
منشور في: (2008)

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
حسب: Kirkland, A, وآخرون
منشور في: (2004)

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
حسب: Kirkland, A, وآخرون
منشور في: (2004)

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
حسب: Kirkland, A, وآخرون
منشور في: (2004)

Confocal operation of a transmission electron microscope with two aberration correctors
حسب: Nellist, P, وآخرون
منشور في: (2006)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
حسب: Nellist, P, وآخرون
منشور في: (2008)

High-resolution TEM and the application of direct and indirect aberration correction.
حسب: Hetherington, C, وآخرون
منشور في: (2008)

Progress in aberration-corrected scanning transmission electron microscopy.
حسب: Dellby, N, وآخرون
منشور في: (2001)

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
حسب: Cosgriff, E, وآخرون
منشور في: (2008)

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
حسب: Ciston, J, وآخرون
منشور في: (2009)

New possibilities with aberration-corrected electron microscopy.
حسب: Cockayne, D, وآخرون
منشور في: (2009)

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
حسب: Nellist, P, وآخرون
منشور في: (2008)

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
حسب: Wang, P, وآخرون
منشور في: (2009)

Aberration corrected tilt series restoration
حسب: Haigh, S, وآخرون
منشور في: (2008)

Aberration corrected TEM: current status and future prospects
حسب: Kirkland, A, وآخرون
منشور في: (2008)

Aberration-Corrected Imaging in CTEM
حسب: Haigh, S, وآخرون
منشور في: (2011)

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
حسب: Wang, P, وآخرون
منشور في: (2010)

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
حسب: Wang, P, وآخرون
منشور في: (2011)

Aberration-corrected transmission electron microscopy of a non-graphitizing carbon
حسب: Allen, CS, وآخرون
منشور في: (2022)

Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
حسب: Wang, P, وآخرون
منشور في: (2010)

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
حسب: Cosgriff, E, وآخرون
منشور في: (2010)

A versatile double aberration-corrected, energy filtered HREM/STEM for materials science.
حسب: Hutchison, J, وآخرون
منشور في: (2005)

The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy
حسب: Ortega, Eduardo, وآخرون
منشور في: (2023)

Image formation mechanisms in three-dimensional aberration-corrected scanning transmission electron microscopy
حسب: Cosgriff, EC
منشور في: (2008)

Applications of the Oxford-JEOL aberration-corrected electron microscope
حسب: Nellist, P, وآخرون
منشور في: (2010)

Transmission electron microscopy and diffractometry of materials /
حسب: Fultz, B. (Brent), وآخرون
منشور في: (2008)

Aberration Correction and Exit Wave Reconstruction Using Tilt Azimuth Data
حسب: Kirkland, A, وآخرون
منشور في: (2009)

Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration.
حسب: Haigh, S, وآخرون
منشور في: (2010)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
حسب: Behan, G, وآخرون
منشور في: (2009)

The application of spherical aberration correction and focal series restoration to high-resolution images of platinum nanocatalyst particles
حسب: Gontard, L, وآخرون
منشور في: (2006)

Specimen preparation for transmission electron microscopy of materials /
حسب: 262434 Goodhew, Peter J.
منشور في: (1984)

Examining co-based nanocrystals on graphene using low-voltage aberration-corrected transmission electron microscopy.
حسب: Warner, J, وآخرون
منشور في: (2010)

Examining co-based nanocrystals on graphene using low-voltage aberration- corrected transmission electron microscopy
حسب: Warner, J, وآخرون
منشور في: (2010)

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles.
حسب: Gontard, L, وآخرون
منشور في: (2007)

In-situ observations of restructuring carbon nanotubes via low-voltage aberration-corrected transmission electron microscopy
حسب: Börrnert, F, وآخرون
منشور في: (2011)

Detectors—the ongoing revolution in scanning transmission electron microscopy and why this important to material characterization
حسب: MacLaren, I, وآخرون
منشور في: (2020)