Transmission electron microscopy without aberrations: Applications to materials science

Transmission electron microscopy without aberrations: Applications to materials science

Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approac...

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Dades bibliogràfiques
Autors principals:	Kirkland, A, Chang, L, Haigh, S, Hetherington, C
Format:	Conference item
Publicat:	2008

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