The structure of rare earth thin films: holmium and gadolinium on yttrium
Single-crystal holmium and gadolinium layers have been grown on yttrium substrates using the molecular beam epitaxy technique and their structures investigated using high resolution x-ray scattering. The experiments were performed using a Philips MRD diffractometer in Oxford, and with the XMaS facil...
| Päätekijät: | , , , , |
|---|---|
| Aineistotyyppi: | Journal article |
| Kieli: | English |
| Julkaistu: |
2003
|