DEEP STATES ASSOCIATED WITH PLATINUM DECORATED STACKING-FAULTS IN SILICON

Samankaltaisia teoksia

• Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers
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• GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
  Tekijä: Decoteau, M, et al.
  Julkaistu: (1990)
• ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON.
  Tekijä: Ourmazd, A, et al.
  Julkaistu: (1982)
• THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON
  Tekijä: Ourmazd, A, et al.
  Julkaistu: (1983)
• Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
  Tekijä: Radu Hristu, et al.
  Julkaistu: (2017-07-01)