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DEEP STATES ASSOCIATED WITH PL...
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DEEP STATES ASSOCIATED WITH PLATINUM DECORATED STACKING-FAULTS IN SILICON
Manylion Llyfryddiaeth
Prif Awduron:
Lahiji, G
,
Peaker, A
,
Hamilton, B
Fformat:
Conference item
Cyhoeddwyd:
1989
Daliadau
Disgrifiad
Eitemau Tebyg
Dangos Staff
Eitemau Tebyg
Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers
gan: Theresa Trötschler, et al.
Cyhoeddwyd: (2025-02-01)
GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
gan: Decoteau, M, et al.
Cyhoeddwyd: (1990)
ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON.
gan: Ourmazd, A, et al.
Cyhoeddwyd: (1982)
THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON
gan: Ourmazd, A, et al.
Cyhoeddwyd: (1983)
Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
gan: Radu Hristu, et al.
Cyhoeddwyd: (2017-07-01)