DEEP STATES ASSOCIATED WITH PLATINUM DECORATED STACKING-FAULTS IN SILICON

Παρόμοια τεκμήρια

• Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers
  ανά: Theresa Trötschler, κ.ά.
  Έκδοση: (2025-02-01)
• GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
  ανά: Decoteau, M, κ.ά.
  Έκδοση: (1990)
• ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON.
  ανά: Ourmazd, A, κ.ά.
  Έκδοση: (1982)
• THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON
  ανά: Ourmazd, A, κ.ά.
  Έκδοση: (1983)
• Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
  ανά: Radu Hristu, κ.ά.
  Έκδοση: (2017-07-01)