DEEP STATES ASSOCIATED WITH PLATINUM DECORATED STACKING-FAULTS IN SILICON

Slični predmeti

• Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers
  od: Theresa Trötschler, i dr.
  Izdano: (2025-02-01)
• GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
  od: Decoteau, M, i dr.
  Izdano: (1990)
• ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON.
  od: Ourmazd, A, i dr.
  Izdano: (1982)
• THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON
  od: Ourmazd, A, i dr.
  Izdano: (1983)
• Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
  od: Radu Hristu, i dr.
  Izdano: (2017-07-01)