DEEP STATES ASSOCIATED WITH PLATINUM DECORATED STACKING-FAULTS IN SILICON

類似資料

• Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers
  著者:: Theresa Trötschler, 等
  出版事項: (2025-02-01)
• GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
  著者:: Decoteau, M, 等
  出版事項: (1990)
• ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON.
  著者:: Ourmazd, A, 等
  出版事項: (1982)
• THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON
  著者:: Ourmazd, A, 等
  出版事項: (1983)
• Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
  著者:: Radu Hristu, 等
  出版事項: (2017-07-01)