DEEP STATES ASSOCIATED WITH PLATINUM DECORATED STACKING-FAULTS IN SILICON

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• GETTERING OF COPPER TO OXIDATION INDUCED STACKING-FAULTS IN SILICON
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• ELECTRICAL BEHAVIOUR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING FAULT RIBBONS IN SILICON.
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• THE ELECTRICAL BEHAVIOR OF INDIVIDUAL DISLOCATIONS, SHOCKLEY PARTIALS AND STACKING-FAULT RIBBONS IN SILICON
  Bằng: Ourmazd, A, et al.
  Được phát hành: (1983)
• Identification of stacking faults in silicon carbide by polarization-resolved second harmonic generation microscopy
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