POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES

Bibliografski detalji
Glavni autori:	Liddle, J, Cerezo, A, Grovenor, C
Format:	Journal article
Izdano:	1989

Slični predmeti

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
od: Cerezo, A, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
od: Cerezo, A, i dr.
Izdano: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
od: Cerezo, A, i dr.
Izdano: (1989)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
od: Liddle, J, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS
od: Liddle, J, i dr.
Izdano: (1989)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1989)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1989)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
od: Grovenor, C, i dr.
Izdano: (1992)

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
od: Hetherington, M, i dr.
Izdano: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Grovenor, C, i dr.
Izdano: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
od: Mackenzie, R, i dr.
Izdano: (1990)

PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS
od: Liddle, J, i dr.
Izdano: (1988)

3D atom probe analysis of quantum well and quantum dot materials
od: Cerezo, A, i dr.
Izdano: (2007)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
od: Cerezo, A, i dr.
Izdano: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Cerezo, A, i dr.
Izdano: (1986)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
od: Smith, G, i dr.
Izdano: (1994)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
od: Cerezo, A, i dr.
Izdano: (1991)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
od: Cerezo, A, i dr.
Izdano: (1988)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
od: Grovenor, C, i dr.
Izdano: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
od: Grovenor, C, i dr.
Izdano: (1990)

LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
od: Hyde, J, i dr.
Izdano: (1994)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
od: Cerezo, A, i dr.
Izdano: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
od: Cerezo, A, i dr.
Izdano: (1986)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
od: Mackenzie, R, i dr.
Izdano: (1991)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
od: Mackenzie, R, i dr.
Izdano: (1991)

Three dimensional visualization of semiconductor multi-quantum well interfaces
od: Mackenzie, R, i dr.
Izdano: (1991)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
od: Grovenor, C, i dr.
Izdano: (1985)

1990 BURCH,C.R. PRIZE - JOINT AWARD - THE POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A
Izdano: (1991)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
od: Mackenzie, R, i dr.
Izdano: (1991)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Grovenor, C, i dr.
Izdano: (1983)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
od: Grovenor, C, i dr.
Izdano: (1989)

Atom probe revels the structure of InxGe1-xN based quantum wells in three dimensions
od: Galtrey, M, i dr.
Izdano: (2008)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
od: Cerezo, A, i dr.
Izdano: (1990)

POSITION-SENSITIVE ATOM PROBE STUDIES OF THE COMPOSITION OF OMEGA AND THETA' PRECIPITATES IN AL-CU-MG-AG ALLOYS
od: Grovenor, C, i dr.
Izdano: (1989)

Three-dimensional atom probe analysis of green- and blue-emitting In(x)Ga(1-x)N/GaN multiple quantum well structures
od: Galtrey, M, i dr.
Izdano: (2008)

POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
od: Setna, R, i dr.
Izdano: (1993)

ATOM PROBE ANALYSIS OF PRECIPITATES IN ALZNMG ALLOY 7018
od: Ortner, S, i dr.
Izdano: (1988)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
od: Grovenor, C, i dr.
Izdano: (1982)

Three-dimensional atom probe studies of an InxGa1-xN/GaN multiple quantum well structure: Assessment of possible indium clustering
od: Galtrey, M, i dr.
Izdano: (2007)