POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES

Bibliográfalaš dieđut
Váldodahkkit:	Liddle, J, Cerezo, A, Grovenor, C
Materiálatiipa:	Journal article
Almmustuhtton:	1989

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POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
Dahkki: Liddle, J, et al.
Almmustuhtton: (1989)

POSITION-SENSITIVE ATOM PROBE AND STEM ANALYSIS OF THE MICROCHEMISTRY OF GAINAS/INP QUANTUM WELLS
Dahkki: Liddle, J, et al.
Almmustuhtton: (1989)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1992)

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
Dahkki: Hetherington, M, et al.
Almmustuhtton: (1992)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
Dahkki: Mackenzie, R, et al.
Almmustuhtton: (1990)

PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS
Dahkki: Liddle, J, et al.
Almmustuhtton: (1988)

3D atom probe analysis of quantum well and quantum dot materials
Dahkki: Cerezo, A, et al.
Almmustuhtton: (2007)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1986)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
Dahkki: Smith, G, et al.
Almmustuhtton: (1994)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
Dahkki: Cerezo, A, et al.
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DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1988)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1990)

LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
Dahkki: Hyde, J, et al.
Almmustuhtton: (1994)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1986)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
Dahkki: Mackenzie, R, et al.
Almmustuhtton: (1991)

3-DIMENSIONAL VISUALIZATION OF SEMICONDUCTOR MULTI-QUANTUM-WELL INTERFACES
Dahkki: Mackenzie, R, et al.
Almmustuhtton: (1991)

Three dimensional visualization of semiconductor multi-quantum well interfaces
Dahkki: Mackenzie, R, et al.
Almmustuhtton: (1991)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1985)

1990 BURCH,C.R. PRIZE - JOINT AWARD - THE POSITION-SENSITIVE ATOM PROBE
Dahkki: Cerezo, A
Almmustuhtton: (1991)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
Dahkki: Mackenzie, R, et al.
Almmustuhtton: (1991)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1983)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1989)

Atom probe revels the structure of InxGe1-xN based quantum wells in three dimensions
Dahkki: Galtrey, M, et al.
Almmustuhtton: (2008)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1990)

POSITION-SENSITIVE ATOM PROBE STUDIES OF THE COMPOSITION OF OMEGA AND THETA' PRECIPITATES IN AL-CU-MG-AG ALLOYS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1989)

Three-dimensional atom probe analysis of green- and blue-emitting In(x)Ga(1-x)N/GaN multiple quantum well structures
Dahkki: Galtrey, M, et al.
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POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
Dahkki: Setna, R, et al.
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ATOM PROBE ANALYSIS OF PRECIPITATES IN ALZNMG ALLOY 7018
Dahkki: Ortner, S, et al.
Almmustuhtton: (1988)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1982)

Three-dimensional atom probe studies of an InxGa1-xN/GaN multiple quantum well structure: Assessment of possible indium clustering
Dahkki: Galtrey, M, et al.
Almmustuhtton: (2007)