CRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENA

The possibility of using neutron critical reflection for investigating interfacial phenomena is assessed. Calculations of the reflectivity of neutrons as a function of angle of incidence have been made for a variety of interfaces, using both an optical model and the Schrödinger equation. The informa...

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Main Authors: Hayter, J, Highfield, R, Pullman, B, Thomas, R, Mcmullen, A, Penfold, J
Format: Journal article
Language:English
Published: 1981
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author Hayter, J
Highfield, R
Pullman, B
Thomas, R
Mcmullen, A
Penfold, J
author_facet Hayter, J
Highfield, R
Pullman, B
Thomas, R
Mcmullen, A
Penfold, J
author_sort Hayter, J
collection OXFORD
description The possibility of using neutron critical reflection for investigating interfacial phenomena is assessed. Calculations of the reflectivity of neutrons as a function of angle of incidence have been made for a variety of interfaces, using both an optical model and the Schrödinger equation. The information on the structure of the interfacial region that could be derived from reflectivity profiles is described for the following systems: fatty acid multilayers, black films, the liquid-vapour interface for a one-component system, the solution-vapour interface and the electrode-solution interface. Preliminary experiments have also been done to test the technique using thin films of deuterated stearic acid and copper on glass.
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spelling oxford-uuid:69dfd883-0d02-4b1f-a0ba-66eec013ed182022-03-26T18:53:49ZCRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENAJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:69dfd883-0d02-4b1f-a0ba-66eec013ed18EnglishSymplectic Elements at Oxford1981Hayter, JHighfield, RPullman, BThomas, RMcmullen, APenfold, JThe possibility of using neutron critical reflection for investigating interfacial phenomena is assessed. Calculations of the reflectivity of neutrons as a function of angle of incidence have been made for a variety of interfaces, using both an optical model and the Schrödinger equation. The information on the structure of the interfacial region that could be derived from reflectivity profiles is described for the following systems: fatty acid multilayers, black films, the liquid-vapour interface for a one-component system, the solution-vapour interface and the electrode-solution interface. Preliminary experiments have also been done to test the technique using thin films of deuterated stearic acid and copper on glass.
spellingShingle Hayter, J
Highfield, R
Pullman, B
Thomas, R
Mcmullen, A
Penfold, J
CRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENA
title CRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENA
title_full CRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENA
title_fullStr CRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENA
title_full_unstemmed CRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENA
title_short CRITICAL REFLECTION OF NEUTRONS - A NEW TECHNIQUE FOR INVESTIGATING INTERFACIAL PHENOMENA
title_sort critical reflection of neutrons a new technique for investigating interfacial phenomena
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