Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Electronic contribution to sec...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
Electronic contribution to secondary electron compositional contrast in the scanning electron microscope
Bibliographic Details
Main Authors:
Castell, M
,
Perovic, D
,
Lafontaine, H
Format:
Journal article
Published:
1997
Holdings
Description
Similar Items
Staff View
Similar Items
Quantitative imaging of semiconductor doping distributions using a scanning electron microscope
by: Perovic, D, et al.
Published: (1998)
Doping layer imaging in the field-emission scanning electron microscope
by: Perovic, D, et al.
Published: (1994)
Coupling Clustering and Channeling Contrast in the Scanning Electron Microscope
by: Sahoo Sudeep Kumar, et al.
Published: (2024-01-01)
BACKSCATTERED ELECTRON CONTRAST ON CROSS-SECTIONS OF INTERFACES AND MULTILAYERS IN THE SCANNING ELECTRON-MICROSCOPE
by: Konkol, A, et al.
Published: (1995)
The scanning electron microscope /
by: 454756 Oatley, Charles William
Published: (1972)