FIM AND ATOM-PROBE STUDIES OF DEFECTS IN DOPED TUNGSTEN LAMP WIRES

Slični predmeti

• PROGRESS WITH FIM AND ATOM-PROBE INVESTIGATIONS OF NICKEL-BASED SUPER-ALLOYS
  od: Delargy, K, i dr.
  Izdano: (1979)
• NATURE AND DISTRIBUTION OF DEFECTS IN TUNGSTEN LAMP WIRE
  od: Godfrey, T, i dr.
  Izdano: (1976)
• COMBINED FIM-TEM DETERMINATION OF THE STRUCTURE OF AN INCOHERENT TWIN BOUNDARY IN TUNGSTEN
  od: Beaven, P, i dr.
  Izdano: (1981)
• TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
  od: Beaven, P, i dr.
  Izdano: (1980)
• PERFORMANCE AND APPLICATIONS OF AN IMAGING ATOM-PROBE
  od: Miller, M, i dr.
  Izdano: (1979)