Hole states in fluorine-doped La2CuO4 thin films probed by polarized x-ray-absorption spectroscopy

Hole states in fluorine-doped La2CuO4 thin films probed by polarized x-ray-absorption spectroscopy

High-resolution polarized x-ray-absorption spectra at the O K edge and Cu L edge for c-axis-oriented La2CuO4Fx thin films using a bulk-sensitive x-ray-fluorescence-yield detection method were investigated. In the O 1s absorption edge of La2CuO4Fx, the prepeak at 528.7 eV is assigned to transitions i...

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Bibliographic Details
Main Authors:	Chen, J, Nachimuthu, P, Liu, R, Lees, S, Gibbons, K, Gameson, I, Jones, M, Edwards, P
Format:	Journal article
Language:	English
Published:	1999

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