$Strain mapping using electron backscatter diffraction$

Strain mapping using electron backscatter diffraction

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...

Bibliografski detalji
Glavni autori:	Wilkinson, A, Dingley, D, Meaden, G
Format:	Journal article
Jezik:	English
Izdano:	Springer US 2009

Slični predmeti

High resolution mapping of strains and rotations using electron backscatter diffraction
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High resolution mapping of strains and rotations using electron backscatter diffraction
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Strain tensor mapping at the nanoscale using electron back scatter diffraction
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Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
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Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
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Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
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Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
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Rapid electron backscatter diffraction mapping: painting by numbers
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Direct detection of electron backscatter diffraction patterns.
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High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
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High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
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Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
od: Britton, T, i dr.
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Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
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Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
od: Britton, T, i dr.
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Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
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Electron backscatter diffraction in the silicon nanowires
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THE MEASUREMENT OF LOCAL PLASTIC-DEFORMATION IN A METAL-MATRIX COMPOSITE BY ELECTRON BACKSCATTER PATTERNS
od: Wilkinson, A, i dr.
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Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
od: Schäfer, N, i dr.
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Adaptable physics-based super-resolution for electron backscatter diffraction maps
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High-resolution electron backscatter diffraction in III-nitride semiconductors
od: Vilalta-Clemente, A, i dr.
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High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
od: Wallis, D, i dr.
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In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
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Electron backscatter diffraction in materials characterization
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Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation
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Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
od: Wilkinson, A, i dr.
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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
od: Tong, V, i dr.
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Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
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Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
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High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
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Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
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