$Strain mapping using electron backscatter diffraction$

Strain mapping using electron backscatter diffraction

In this chapter we review the progress that has been made toward elastic strain (i.e., stress) mapping using electron backscatter diffraction. In particular we focus on development of an analysis method based on using cross-correlation to determine small shifts in the EBSD patterns with respect to a...

Ամբողջական նկարագրություն

Մատենագիտական մանրամասներ
Հիմնական հեղինակներ:	Wilkinson, A, Dingley, D, Meaden, G
Ձևաչափ:	Journal article
Լեզու:	English
Հրապարակվել է:	Springer US 2009

Նմանատիպ նյութեր

High resolution mapping of strains and rotations using electron backscatter diffraction
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
‌: Dingley, D, և այլն
Հրապարակվել է: (2010)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2006)

Mapping strains at the nanoscale using electron back scatter diffraction
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2009)

Strain tensor mapping at the nanoscale using electron back scatter diffraction
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2006)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
‌: Britton, T, և այլն
Հրապարակվել է: (2010)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
‌: Kamaya, M, և այլն
Հրապարակվել է: (2005)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
‌: Wilkinson, A
Հրապարակվել է: (1997)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
‌: Kamaya, M, և այլն
Հրապարակվել է: (2006)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
‌: Britton, T, և այլն
Հրապարակվել է: (2011)

Rapid electron backscatter diffraction mapping: painting by numbers
‌: Tong, V, և այլն
Հրապարակվել է: (2018)

Direct detection of electron backscatter diffraction patterns.
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2013)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
‌: Wilkinson, A
Հրապարակվել է: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
‌: Wilkinson, A
Հրապարակվել է: (2006)

Strain mapping using high-resolution electron backscatter diffraction technique: The influence of sample preparation
‌: Nowakowski Pawel, և այլն
Հրապարակվել է: (2024-01-01)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
‌: Britton, T, և այլն
Հրապարակվել է: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
‌: Britton, T, և այլն
Հրապարակվել է: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
‌: Britton, T, և այլն
Հրապարակվել է: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
‌: Britton, T, և այլն
Հրապարակվել է: (2013)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
‌: Britton, T, և այլն
Հրապարակվել է: (2012)

J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
‌: Koko, A, և այլն
Հրապարակվել է: (2021)

Analysis of dislocation densities using high resolution electron backscatter diffraction
‌: Vilalta-Clemente, A, և այլն
Հրապարակվել է: (2015)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
‌: Naresh-Kumar, G, և այլն
Հրապարակվել է: (2017)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
‌: G. Naresh-Kumar, և այլն
Հրապարակվել է: (2017-09-01)

Electron backscatter diffraction in the silicon nanowires
‌: K.K. Dikhanbayev, և այլն
Հրապարակվել է: (2016-10-01)

THE MEASUREMENT OF LOCAL PLASTIC-DEFORMATION IN A METAL-MATRIX COMPOSITE BY ELECTRON BACKSCATTER PATTERNS
‌: Wilkinson, A, և այլն
Հրապարակվել է: (1993)

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.
‌: Schäfer, N, և այլն
Հրապարակվել է: (2016)

Adaptable physics-based super-resolution for electron backscatter diffraction maps
‌: Devendra K. Jangid, և այլն
Հրապարակվել է: (2022-12-01)

High-resolution electron backscatter diffraction in III-nitride semiconductors
‌: Vilalta-Clemente, A, և այլն
Հրապարակվել է: (2015)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
‌: Wallis, D, և այլն
Հրապարակվել է: (2019)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
‌: Koko, A, և այլն
Հրապարակվել է: (2022)

Electron backscatter diffraction in materials characterization
‌: Dejan Stojakovic
Հրապարակվել է: (2012-03-01)

Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation
‌: Yang, D, և այլն
Հրապարակվել է: (2022)

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2018)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
‌: Tong, V, և այլն
Հրապարակվել է: (2015)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2016)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
‌: Wilkinson, A, և այլն
Հրապարակվել է: (2010)

Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
‌: Trager-Cowan, C, և այլն
Հրապարակվել է: (2002)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
‌: Wallis, D, և այլն
Հրապարակվել է: (2016)