High-contrast observations with slicer-based integral field spectrographs 1: Simulations
As part of the Phase A study for the EPICS instrument, we investigate if there are any contrast limitations imposed by the choice of the integral field spectrograph (IFS) technology, and if so, to determine the contrast limits applicable to each technology. In this document we investigate (through s...
| Asıl Yazarlar: | , , , , , |
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| Materyal Türü: | Journal article |
| Dil: | English |
| Baskı/Yayın Bilgisi: |
2010
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| Özet: | As part of the Phase A study for the EPICS instrument, we investigate if there are any contrast limitations imposed by the choice of the integral field spectrograph (IFS) technology, and if so, to determine the contrast limits applicable to each technology. In this document we investigate (through simulations) the contrast limitations inherent in a slicer based IFS. Current results show the achievable contrast with the slicer to be promising when taking into consideration the fact that the central region of the apodized PSF has not been masked. Limiting the maximum intensity by a factor of 100-1000 using an obscuring focal plane mask should also reduce the intensity of the secondary speckles by an equivalent factor. Furthermore, the secondary speckles created in the slicer spectrograph only influence the few slices where the bright central core is imaged. By orienting these slices to lie along the spider arms of the E-ELT secondary, the fraction of the field of view affected can be minimized. © 2010 Copyright SPIE - The International Society for Optical Engineering. |
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