Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi
We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40 nm-thick film of MnSi on Si(111) in the region of the field-temperature phase diagram where a skyrmion phase has been observed in the bulk. We identify changes in the quasistatic magnetic field dist...
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| Main Authors: |
Lancaster, T,
Xiao, F,
Salman, Z,
Thomas, I,
Blundell, S,
Pratt, F,
Clark, S,
Prokscha, T,
Suter, A,
Zhang, S,
Baker, A,
Hesjedal, T |
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| 格式: | Journal article
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| 出版: |
2015
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