Imbrici, P., Grottesi, A., D'Adamo, M., Mannucci, R., Tucker, S., & Pessia, M. (2009). Contribution of the central hydrophobic residue in the PXP motif of voltage-dependent K+ channels to S6 flexibility and gating properties.
Dyfyniad Arddull ChicagoImbrici, P., A. Grottesi, M. D'Adamo, R. Mannucci, S. Tucker, and M. Pessia. Contribution of the Central Hydrophobic Residue in the PXP Motif of Voltage-dependent K+ Channels to S6 Flexibility and Gating Properties. 2009.
Dyfyniad MLAImbrici, P., et al. Contribution of the Central Hydrophobic Residue in the PXP Motif of Voltage-dependent K+ Channels to S6 Flexibility and Gating Properties. 2009.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.