Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells
The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, f...
Үндсэн зохиолчид: | Abou-Ras, D, Kavalakkatt, J, Nichterwitz, M, Schaefer, N, Harndt, S, Wilkinson, A, Tsyrulin, K, Schulz, H, Bauer, F |
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Формат: | Journal article |
Хэвлэсэн: |
2013
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Ижил төстэй зүйлс
Ижил төстэй зүйлс
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