Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells

The present work gives an overview of the application of electron backscatter diffraction (EBSD) in the field of thin-film solar cells, which consist of stacks of polycrystalline layers on various rigid or flexible substrates. EBSD provides access to grain-size and local-orientation distributions, f...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Abou-Ras, D, Kavalakkatt, J, Nichterwitz, M, Schaefer, N, Harndt, S, Wilkinson, A, Tsyrulin, K, Schulz, H, Bauer, F
Μορφή: Journal article
Έκδοση: 2013