A comparison of the hard-switching performance of 650V power transistors with calorimetric verification
We compare the switching losses of four equivalent silicon and wide-bandgap 650V power transistors operated in a hard-switched half-bridge configuration, switching 400V at 40A. Each transistor is mounted on an identical PCB and driven by a gate drive circuit matched to its requirements. Switching sp...
| Κύριοι συγγραφείς: | , , , , , |
|---|---|
| Μορφή: | Journal article |
| Γλώσσα: | English |
| Έκδοση: |
IEEE
2023
|