Defects at the nanoscale impact contact line motion at all scales

The contact angle of a liquid drop moving on a real solid surface depends on the speed and direction of motion of the three-phase contact line. Many experiments have demonstrated that pinning on surface defects, thermal activation and viscous dissipation impact contact line dynamics, but so far, eff...

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Main Authors: Perrin, H, Lhermerout, R, Davitt, K, Rolley, E, Andreotti, B
Format: Journal article
Language:English
Published: American Physical Society 2016
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author Perrin, H
Lhermerout, R
Davitt, K
Rolley, E
Andreotti, B
author_facet Perrin, H
Lhermerout, R
Davitt, K
Rolley, E
Andreotti, B
author_sort Perrin, H
collection OXFORD
description The contact angle of a liquid drop moving on a real solid surface depends on the speed and direction of motion of the three-phase contact line. Many experiments have demonstrated that pinning on surface defects, thermal activation and viscous dissipation impact contact line dynamics, but so far, efforts have failed to disentangle the role of each of these dissipation channels. Here, we propose a unifying multiscale approach that provides a single quantitative framework. We use this approach to successfully account for the dynamics measured in a classic dip-coating experiment performed over an unprecedentedly wide range of velocity. We show that the full contact line dynamics up to the liquid film entrainment threshold can be parametrized by the size, amplitude and density of nanometer-scale defects. This leads us to reinterpret the contact angle hysteresis as a dynamical crossover rather than a depinning transition.
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spelling oxford-uuid:7121c9ed-9fcb-437e-ac6a-ea4bd2852db72022-03-26T19:41:37ZDefects at the nanoscale impact contact line motion at all scalesJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:7121c9ed-9fcb-437e-ac6a-ea4bd2852db7EnglishSymplectic Elements at OxfordAmerican Physical Society2016Perrin, HLhermerout, RDavitt, KRolley, EAndreotti, BThe contact angle of a liquid drop moving on a real solid surface depends on the speed and direction of motion of the three-phase contact line. Many experiments have demonstrated that pinning on surface defects, thermal activation and viscous dissipation impact contact line dynamics, but so far, efforts have failed to disentangle the role of each of these dissipation channels. Here, we propose a unifying multiscale approach that provides a single quantitative framework. We use this approach to successfully account for the dynamics measured in a classic dip-coating experiment performed over an unprecedentedly wide range of velocity. We show that the full contact line dynamics up to the liquid film entrainment threshold can be parametrized by the size, amplitude and density of nanometer-scale defects. This leads us to reinterpret the contact angle hysteresis as a dynamical crossover rather than a depinning transition.
spellingShingle Perrin, H
Lhermerout, R
Davitt, K
Rolley, E
Andreotti, B
Defects at the nanoscale impact contact line motion at all scales
title Defects at the nanoscale impact contact line motion at all scales
title_full Defects at the nanoscale impact contact line motion at all scales
title_fullStr Defects at the nanoscale impact contact line motion at all scales
title_full_unstemmed Defects at the nanoscale impact contact line motion at all scales
title_short Defects at the nanoscale impact contact line motion at all scales
title_sort defects at the nanoscale impact contact line motion at all scales
work_keys_str_mv AT perrinh defectsatthenanoscaleimpactcontactlinemotionatallscales
AT lhermeroutr defectsatthenanoscaleimpactcontactlinemotionatallscales
AT davittk defectsatthenanoscaleimpactcontactlinemotionatallscales
AT rolleye defectsatthenanoscaleimpactcontactlinemotionatallscales
AT andreottib defectsatthenanoscaleimpactcontactlinemotionatallscales