$Strain tensor mapping at the nanoscale using electron back scatter diffraction$

Strain tensor mapping at the nanoscale using electron back scatter diffraction

Bibliografiske detaljer
Main Authors:	Wilkinson, A, Meaden, G, Dingley, D
Format:	Journal article
Sprog:	English
Udgivet:	2006

Lignende værker

Mapping strains at the nanoscale using electron back scatter diffraction
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Strain measurement using electron back scatter diffraction
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Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
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Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
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Measurement of small misorientations using electron back scatter diffraction
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Determination of elastic strain fields and geometrically necessary dislocation distributions near nanoindents using electron back scatter diffraction
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Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
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High resolution electron back-scatter diffraction analysis of thermally and mechanically induced strains near carbide inclusions in a superalloy
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Scanning electron diffraction reveals the molecular ordering of polysaccharides at the nanoscale
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Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
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High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
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High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
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Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
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Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
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