Strain tensor mapping at the nanoscale using electron back scatter diffraction
Κύριοι συγγραφείς: | Wilkinson, A, Meaden, G, Dingley, D |
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Μορφή: | Journal article |
Γλώσσα: | English |
Έκδοση: |
2006
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Παρόμοια τεκμήρια
Παρόμοια τεκμήρια
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Mapping strains at the nanoscale using electron back scatter diffraction
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Έκδοση: (2009) -
Strain mapping using electron backscatter diffraction
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Έκδοση: (2009) -
Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
ανά: Dingley, D, κ.ά.
Έκδοση: (2010) -
High resolution mapping of strains and rotations using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2006) -
High resolution mapping of strains and rotations using electron backscatter diffraction
ανά: Wilkinson, A, κ.ά.
Έκδοση: (2013)