$Strain tensor mapping at the nanoscale using electron back scatter diffraction$

Strain tensor mapping at the nanoscale using electron back scatter diffraction

Bibliografiset tiedot
Päätekijät:	Wilkinson, A, Meaden, G, Dingley, D
Aineistotyyppi:	Journal article
Kieli:	English
Julkaistu:	2006

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