Strain tensor mapping at the nanoscale using electron back scatter diffraction
Huvudupphovsmän: | Wilkinson, A, Meaden, G, Dingley, D |
---|---|
Materialtyp: | Journal article |
Språk: | English |
Publicerad: |
2006
|
Liknande verk
Liknande verk
-
Mapping strains at the nanoscale using electron back scatter diffraction
av: Wilkinson, A, et al.
Publicerad: (2009) -
Strain mapping using electron backscatter diffraction
av: Wilkinson, A, et al.
Publicerad: (2009) -
Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
av: Dingley, D, et al.
Publicerad: (2010) -
High resolution mapping of strains and rotations using electron backscatter diffraction
av: Wilkinson, A, et al.
Publicerad: (2006) -
High resolution mapping of strains and rotations using electron backscatter diffraction
av: Wilkinson, A, et al.
Publicerad: (2013)