Strain tensor mapping at the nanoscale using electron back scatter diffraction

Míreanna comhchosúla

• Mapping strains at the nanoscale using electron back scatter diffraction
  de réir: Wilkinson, A, et al.
  Foilsithe / Cruthaithe: (2009)
• Strain mapping using electron backscatter diffraction
  de réir: Wilkinson, A, et al.
  Foilsithe / Cruthaithe: (2009)
• Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
  de réir: Dingley, D, et al.
  Foilsithe / Cruthaithe: (2010)
• High resolution mapping of strains and rotations using electron backscatter diffraction
  de réir: Wilkinson, A, et al.
  Foilsithe / Cruthaithe: (2006)
• High resolution mapping of strains and rotations using electron backscatter diffraction
  de réir: Wilkinson, A, et al.
  Foilsithe / Cruthaithe: (2013)