Cross section measurements of high-p(T) dilepton final-state processes using a global fitting method

Cross section measurements of high-p(T) dilepton final-state processes using a global fitting method

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Xehetasun bibliografikoak
Egile Nagusiak:	Abulencia, A, Adelman, J, Affolder, T, Akimoto, T, Albrow, MG, Ambrose, D, Amerio, S, Amidei, D, Anastassov, A, Anikeev, K, Annovi, A, Antos, J, Aoki, M, Apollinari, G, Arguin, J, Arisawa, T, Artikov, A, Ashmanskas, W, Attal, A, Azfar, F, Azzi-Bacchetta, P, Azzurri, P, Bacchetta, N, Badgett, W, Barbaro-Galtieri, A
Formatua:	Journal article
Argitaratua:	2008

Antzeko izenburuak

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