Cross section measurements of high-p(T) dilepton final-state processes using a global fitting method

Cross section measurements of high-pT dilepton final-state processes using a global fitting method af Abulencia, A, Adelman, J, Affolder, T, Akimoto, T, Albrow, MG, Ambrose, D, Amerio, S, Amidei, D, Anastassov, A, Anikeev, K, Annovi, A, Antos, J, Aoki, M, Apollinari, G, Arguin, J, Arisawa, T, Artikov, A, Ashmanskas, W, Attal, A, Azfar, F, Azzi-Bacchetta, P, Azzurri, P, Bacchetta, N, Badgett, W, Barbaro-Galtieri, A