Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution.

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution.

Recent development in fast pixelated detector technology has allowed a two dimensional diffraction pattern to be recorded at every probe position of a two dimensional raster scan in a scanning transmission electron microscope (STEM), forming an information-rich four dimensional (4D) dataset. Electro...

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Bibliographic Details
Main Authors: Yang, H, MacLaren, I, Jones, L, Martinez, G, Simson, M, Huth, M, Ryll, H, Soltau, H, Sagawa, R, Kondo, Y, Ophus, C, Ercius, P, Jin, L, Kovács, A, Nellist, P
Format: Journal article
Language:English
Published: Elsevier 2017

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