Investigation of surface acoustic wave scattering effects
We present measurements of surface acoustic wave (SAW) scattering from single dots, periodic and locally disturbed two-dimensional dot arrays. By using the scanning acoustic force microscope (SAFM), SAW fields of arbitrary polarization can be imaged with submicron spatial resolution and sub-Å wave a...
| Үндсэн зохиолчид: | , |
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| Формат: | Conference item |
| Хэвлэсэн: |
2001
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| _version_ | 1826278996768194560 |
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| author | Hesjedal, T Behme, G |
| author_facet | Hesjedal, T Behme, G |
| author_sort | Hesjedal, T |
| collection | OXFORD |
| description | We present measurements of surface acoustic wave (SAW) scattering from single dots, periodic and locally disturbed two-dimensional dot arrays. By using the scanning acoustic force microscope (SAFM), SAW fields of arbitrary polarization can be imaged with submicron spatial resolution and sub-Å wave amplitude sensitivity. The influence of a wavelength-sized single dot on SAW diffraction is studied. Forward- and back-scattered wave components can be imaged by insonifying the dot with a pump and a probe beam under different angles. SAW diffraction images of a regular dot array reveal a wavefield that is localized around the dots. In case of a disturbed scattering array, the localized SAW pattern vanishes in the vicinity of the distortion. |
| first_indexed | 2024-03-06T23:52:15Z |
| format | Conference item |
| id | oxford-uuid:730094e9-ec9f-4f5b-bd0c-eb9abafaa9eb |
| institution | University of Oxford |
| last_indexed | 2024-03-06T23:52:15Z |
| publishDate | 2001 |
| record_format | dspace |
| spelling | oxford-uuid:730094e9-ec9f-4f5b-bd0c-eb9abafaa9eb2022-03-26T19:53:40ZInvestigation of surface acoustic wave scattering effectsConference itemhttp://purl.org/coar/resource_type/c_5794uuid:730094e9-ec9f-4f5b-bd0c-eb9abafaa9ebSymplectic Elements at Oxford2001Hesjedal, TBehme, GWe present measurements of surface acoustic wave (SAW) scattering from single dots, periodic and locally disturbed two-dimensional dot arrays. By using the scanning acoustic force microscope (SAFM), SAW fields of arbitrary polarization can be imaged with submicron spatial resolution and sub-Å wave amplitude sensitivity. The influence of a wavelength-sized single dot on SAW diffraction is studied. Forward- and back-scattered wave components can be imaged by insonifying the dot with a pump and a probe beam under different angles. SAW diffraction images of a regular dot array reveal a wavefield that is localized around the dots. In case of a disturbed scattering array, the localized SAW pattern vanishes in the vicinity of the distortion. |
| spellingShingle | Hesjedal, T Behme, G Investigation of surface acoustic wave scattering effects |
| title | Investigation of surface acoustic wave scattering effects |
| title_full | Investigation of surface acoustic wave scattering effects |
| title_fullStr | Investigation of surface acoustic wave scattering effects |
| title_full_unstemmed | Investigation of surface acoustic wave scattering effects |
| title_short | Investigation of surface acoustic wave scattering effects |
| title_sort | investigation of surface acoustic wave scattering effects |
| work_keys_str_mv | AT hesjedalt investigationofsurfaceacousticwavescatteringeffects AT behmeg investigationofsurfaceacousticwavescatteringeffects |