Britton, T., Maurice, C., Fortunier, R., Driver, J., Day, A., Meaden, G., . . . Wilkinson, A. (2010). Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
Cita Chicago (17th ed.)Britton, T., C. Maurice, R. Fortunier, J. Driver, A. Day, G. Meaden, D. Dingley, K. Mingard, i A. Wilkinson. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
Cita MLA (9th ed.)Britton, T., et al. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
Atenció: Aquestes cites poden no estar 100% correctes.