Britton, T., Maurice, C., Fortunier, R., Driver, J., Day, A., Meaden, G., . . . Wilkinson, A. (2010). Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
Chicago Style (17th ed.) CitationBritton, T., C. Maurice, R. Fortunier, J. Driver, A. Day, G. Meaden, D. Dingley, K. Mingard, and A. Wilkinson. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
ציטוט MLABritton, T., et al. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
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