Britton, T., Maurice, C., Fortunier, R., Driver, J., Day, A., Meaden, G., . . . Wilkinson, A. (2010). Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
Citazione stile Chigago Style (17a edizione)Britton, T., C. Maurice, R. Fortunier, J. Driver, A. Day, G. Meaden, D. Dingley, K. Mingard, e A. Wilkinson. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
Citatione MLA (9a ed.)Britton, T., et al. Factors Affecting the Accuracy of High Resolution Electron Backscatter Diffraction When Using Simulated Patterns. 2010.
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